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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/DasWMHPJKB05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Clyde_Washburn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jan_Kolnik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeff_Burleson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung-Geau_Jang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Paradis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._R._Mukund>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steve_Howard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tejasvi_Das>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2005.86>
foaf:homepage <https://doi.org/10.1109/ICVD.2005.86>
dc:identifier DBLP conf/vlsid/DasWMHPJKB05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2005.86 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Clyde_Washburn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jan_Kolnik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeff_Burleson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung-Geau_Jang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Paradis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._R._Mukund>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steve_Howard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tejasvi_Das>
swrc:pages 295-300 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/DasWMHPJKB05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/DasWMHPJKB05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2005.html#DasWMHPJKB05>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.2005.86>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document