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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/GhoshFB10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amlan_Ghosh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_B._Brown>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rob_Franklin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSI.Design.2010.69>
foaf:homepage <https://doi.org/10.1109/VLSI.Design.2010.69>
dc:identifier DBLP conf/vlsid/GhoshFB10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSI.Design.2010.69 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amlan_Ghosh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_B._Brown>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rob_Franklin>
swrc:pages 369-374 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/GhoshFB10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/GhoshFB10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2010.html#GhoshFB10>
rdfs:seeAlso <https://doi.org/10.1109/VLSI.Design.2010.69>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject NBTI, analog circuit design methodologies, input switching, body biasing. (xsd:string)
dc:title Analog Circuit Design Methodologies to Improve Negative-Bias Temperature Instability Degradation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document