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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/HasanPA10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ajoy_Kumar_Palit>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shehzad_Hasan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Walter_Anheier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSI.Design.2010.30>
foaf:homepage <https://doi.org/10.1109/VLSI.Design.2010.30>
dc:identifier DBLP conf/vlsid/HasanPA10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSI.Design.2010.30 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Test Pattern Generation and Compaction for Crosstalk Induced Glitches and Delay Faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ajoy_Kumar_Palit>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shehzad_Hasan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Walter_Anheier>
swrc:pages 345-350 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/HasanPA10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/HasanPA10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2010.html#HasanPA10>
rdfs:seeAlso <https://doi.org/10.1109/VLSI.Design.2010.30>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Automatic Test Pattern Generation, Crosstalk Faults, Switching Windows, Test Set Compaction (xsd:string)
dc:title Test Pattern Generation and Compaction for Crosstalk Induced Glitches and Delay Faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document