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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/HurstS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jason_P._Hurst>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512150>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512150>
dc:identifier DBLP conf/vlsid/HurstS95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512150 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label A differential built-in current sensor design for high speed IDDQ testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jason_P._Hurst>
swrc:pages 419-423 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/HurstS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/HurstS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#HurstS95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512150>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject built-in self test; integrated circuit testing; electric sensing devices; electric current measurement; CMOS digital integrated circuits; design for testability; integrated circuit design; VLSI; built-in current sensor design; high speed IDDQ testing; differential architecture; quiescent current detection; built-in self-test; BIST environment; n-well technology; MOSIS; 2 micron; 31.25 MHz (xsd:string)
dc:title A differential built-in current sensor design for high speed IDDQ testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document