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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/JainKVP06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Vinay_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._M._Vasi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahesh_B._Patil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Palkesh_Jain>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSID.2006.85>
foaf:homepage <https://doi.org/10.1109/VLSID.2006.85>
dc:identifier DBLP conf/vlsid/JainKVP06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSID.2006.85 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Evaluation of Non-Quasi-Static Effects during SEU in Deep-Submicron MOS Devices and Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Vinay_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._M._Vasi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahesh_B._Patil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Palkesh_Jain>
swrc:pages 188-193 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/JainKVP06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/JainKVP06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2006.html#JainKVP06>
rdfs:seeAlso <https://doi.org/10.1109/VLSID.2006.85>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Evaluation of Non-Quasi-Static Effects during SEU in Deep-Submicron MOS Devices and Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document