On Test Pattern Compaction Using Random Pattern Fault Simulation. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/KajiharaS98>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Seiji_Kajihara>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FICVD.1998.646650>
foaf:homepage	<https://doi.org/10.1109/ICVD.1998.646650>
dc:identifier	DBLP conf/vlsid/KajiharaS98 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FICVD.1998.646650 (xsd:string)
dcterms:issued	1998 (xsd:gYear)
rdfs:label	On Test Pattern Compaction Using Random Pattern Fault Simulation. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Seiji_Kajihara>
swrc:pages	464-469 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1998>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vlsid/KajiharaS98/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vlsid/KajiharaS98>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vlsid/vlsid1998.html#KajiharaS98>
rdfs:seeAlso	<https://doi.org/10.1109/ICVD.1998.646650>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject	test generation, test compaction, fault simulation, stuck-at fault, combinational circuit (xsd:string)
dc:title	On Test Pattern Compaction Using Random Pattern Fault Simulation. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document