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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/KannanKGTAM13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anurag_Gupta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Friedrich_Taenzler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Moushegian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Richard_Antley>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sukeshwar_Kannan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSID.2013.202>
foaf:homepage <https://doi.org/10.1109/VLSID.2013.202>
dc:identifier DBLP conf/vlsid/KannanKGTAM13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSID.2013.202 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Physics Based Fault Models for Testing High-Voltage LDMOS. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anurag_Gupta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Friedrich_Taenzler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Moushegian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Richard_Antley>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sukeshwar_Kannan>
swrc:pages 285-290 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/KannanKGTAM13/dblp>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2013.html#KannanKGTAM13>
rdfs:seeAlso <https://doi.org/10.1109/VLSID.2013.202>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Physics Based Fault Models for Testing High-Voltage LDMOS. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document