[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/KrishnaACB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amit_K._Aditya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/G._Hari_Rama_Krishna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nirmal_B._Chakrabarti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Swapna_Banerjee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512122>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512122>
dc:identifier DBLP conf/vlsid/KrishnaACB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512122 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Analysis of temperature dependence of Si-Ge HBT. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amit_K._Aditya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/G._Hari_Rama_Krishna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nirmal_B._Chakrabarti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Swapna_Banerjee>
swrc:pages 268-271 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/KrishnaACB95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/KrishnaACB95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#KrishnaACB95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512122>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject semiconductor materials; heterojunction bipolar transistors; finite element analysis; semiconductor device models; Ge-Si alloys; simulation; thermal analysis; temperature dependence; FEM; heterojunction bipolar transistors; Ge mole-fraction; two dimensional device simulator; BISOF; finite element method; current gain; graded HBT; 200 to 300 K; SiGe (xsd:string)
dc:title Analysis of temperature dependence of Si-Ge HBT. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document