On test coverage of path delay faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/MajhiJPA96
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/MajhiJPA96
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ananta_K._Majhi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/James_Jacob
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lalit_M._Patnaik
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489645
>
foaf:
homepage
<
https://doi.org/10.1109/ICVD.1996.489645
>
dc:
identifier
DBLP conf/vlsid/MajhiJPA96
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FICVD.1996.489645
(xsd:string)
dcterms:
issued
1996
(xsd:gYear)
rdfs:
label
On test coverage of path delay faults.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ananta_K._Majhi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/James_Jacob
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lalit_M._Patnaik
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal
>
swrc:
pages
418-421
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vlsid/MajhiJPA96/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vlsid/MajhiJPA96
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#MajhiJPA96
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ICVD.1996.489645
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vlsid
>
dc:
subject
delays; combinational circuits; fault diagnosis; logic testing; redundancy; circuit analysis computing; computational complexity; path delay faults; test coverage; coverage metric; two-pass test generation method; combinational logic circuits; falling transition; line delay test; longest sensitizable path; longest paths; fault simulation; decreasing length; redundant stuck-at fault; benchmark circuits
(xsd:string)
dc:
title
On test coverage of path delay faults.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document