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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/MohammadSY00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alex_S._Yap>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Gh._Mohammad>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2000.812641>
foaf:homepage <https://doi.org/10.1109/ICVD.2000.812641>
dc:identifier DBLP conf/vlsid/MohammadSY00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2000.812641 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Testing Flash Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alex_S._Yap>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammad_Gh._Mohammad>
swrc:pages 406-411 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/MohammadSY00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/MohammadSY00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2000.html#MohammadSY00>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.2000.812641>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Flash memories, Testing, Disturbances, FG transistor (xsd:string)
dc:title Testing Flash Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document