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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/NagarajHBC05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cyrus_D._Cantrell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._S._Nagaraj>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Poras_T._Balsara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_R._Hunter>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2005.164>
foaf:homepage <https://doi.org/10.1109/ICVD.2005.164>
dc:identifier DBLP conf/vlsid/NagarajHBC05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2005.164 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label The Impact of Inductance on Transients Affecting Gate Oxide Reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cyrus_D._Cantrell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._S._Nagaraj>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Poras_T._Balsara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_R._Hunter>
swrc:pages 709-713 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/NagarajHBC05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/NagarajHBC05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2005.html#NagarajHBC05>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.2005.164>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title The Impact of Inductance on Transients Affecting Gate Oxide Reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document