Efficient multisine testing of analog circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/NagiCBA95
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1995
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Efficient multisine testing of analog circuits.
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integrated circuit testing; fault diagnosis; analogue integrated circuits; automatic testing; built-in self test; waveform analysis; biquadratic filters; multisine testing; analog circuits; test waveform generation; linear analog circuits; test confidence; fault-based automatic test pattern generator; successive gradient method; sinusoidal signals; fault coverage maximization; built-in test; biquadratic filter; AC testing; analog IC
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Efficient multisine testing of analog circuits.
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