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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/NagiCBA95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ashok_Balivada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naveena_Nagi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512115>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512115>
dc:identifier DBLP conf/vlsid/NagiCBA95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512115 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Efficient multisine testing of analog circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ashok_Balivada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_A._Abraham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naveena_Nagi>
swrc:pages 234-238 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/NagiCBA95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/NagiCBA95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#NagiCBA95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512115>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject integrated circuit testing; fault diagnosis; analogue integrated circuits; automatic testing; built-in self test; waveform analysis; biquadratic filters; multisine testing; analog circuits; test waveform generation; linear analog circuits; test confidence; fault-based automatic test pattern generator; successive gradient method; sinusoidal signals; fault coverage maximization; built-in test; biquadratic filter; AC testing; analog IC (xsd:string)
dc:title Efficient multisine testing of analog circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document