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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/NandiCC96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Parimal_Pal_Chaudhuri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Santanu_Chattopadhyay>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sukumar_Nandi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489456>
foaf:homepage <https://doi.org/10.1109/ICVD.1996.489456>
dc:identifier DBLP conf/vlsid/NandiCC96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1996.489456 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Programmable cellular automata based testbed for fault diagnosis in VLSI circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Parimal_Pal_Chaudhuri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Santanu_Chattopadhyay>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sukumar_Nandi>
swrc:pages 61-64 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/NandiCC96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/NandiCC96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#NandiCC96>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1996.489456>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject cellular automata; fault diagnosis; logic testing; VLSI; integrated circuit testing; logic partitioning; automatic testing; programmable cellular automata; fault diagnosis; VLSI circuits; signature analyzer; polynomial algebraic tools; faulty signatures; partitions; multiple attractor; fault dictionary size; cascadable structure (xsd:string)
dc:title Programmable cellular automata based testbed for fault diagnosis in VLSI circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document