Dynamic test Sequence compaction for Sequential Circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Anand_Raghunathan>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489479>
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dcterms:issued	1996 (xsd:gYear)
rdfs:label	Dynamic test Sequence compaction for Sequential Circuits. (xsd:string)
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swrc:pages	170-173 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#RaghunathanC96>
rdfs:seeAlso	<https://doi.org/10.1109/ICVD.1996.489479>
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dc:title	Dynamic test Sequence compaction for Sequential Circuits. (xsd:string)
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