On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/RahamanKDB08
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On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set.
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Missing-gate faults, quantum computing, reversible logic, testable design, universal test set
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On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set.
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