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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/RudnickP95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elizabeth_M._Rudnick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512126>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512126>
dc:identifier DBLP conf/vlsid/RudnickP95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512126 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label A genetic approach to test application time reduction for full scan and partial scan circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elizabeth_M._Rudnick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
swrc:pages 288-293 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/RudnickP95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/RudnickP95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#RudnickP95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512126>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject genetic algorithms; design for testability; flip-flops; logic testing; sequential circuits; combinational circuits; logic design; test application time reduction; full scan circuits; partial scan circuits; design-for-testability techniques; genetic algorithms; compact test set generation; DFT (xsd:string)
dc:title A genetic approach to test application time reduction for full scan and partial scan circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document