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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/SableSPC04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arun_N._Chandorkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajeshwar_S._Sable>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ravindra_P._Saraf>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rubin_A._Parekhji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2004.1261019>
foaf:homepage <https://doi.org/10.1109/ICVD.2004.1261019>
dc:identifier DBLP conf/vlsid/SableSPC04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2004.1261019 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arun_N._Chandorkar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajeshwar_S._Sable>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ravindra_P._Saraf>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rubin_A._Parekhji>
swrc:pages 753-756 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/SableSPC04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/SableSPC04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2004.html#SableSPC04>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.2004.1261019>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Built-in self-test for memories, neighbourhood pattern sensitive faults, programmable BIST (xsd:string)
dc:title Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document