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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/SawhneyR95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haroon_Rasheed>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Puneet_Sawhney>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512104>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512104>
dc:identifier DBLP conf/vlsid/SawhneyR95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512104 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haroon_Rasheed>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Puneet_Sawhney>
swrc:pages 191- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/SawhneyR95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/SawhneyR95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#SawhneyR95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512104>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject SRAM chips; application specific integrated circuits; integrated circuit design; circuit CAD; static RAM generators; automatic generator characterisation tool; triple-metal embedded array; module generators; metallized SRAMs; single-port static RAMs; dual-port static RAMs; ASIC design; user-defined size; aspect ratio; SRAM chips; 0.5 micron (xsd:string)
dc:title Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document