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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/SedghiKAFN08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Armin_Alaghi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elnaz_Koopahi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahmood_Fathy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahshid_Sedghi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zainalabedin_Navabi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSI.2008.111>
foaf:homepage <https://doi.org/10.1109/VLSI.2008.111>
dc:identifier DBLP conf/vlsid/SedghiKAFN08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSI.2008.111 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Armin_Alaghi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elnaz_Koopahi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahmood_Fathy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahshid_Sedghi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zainalabedin_Navabi>
swrc:pages 409-414 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/SedghiKAFN08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/SedghiKAFN08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2008.html#SedghiKAFN08>
rdfs:seeAlso <https://doi.org/10.1109/VLSI.2008.111>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document