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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/SikdarPBCBYM00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Biplab_K._Sikdar>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gosta_Pada_Biswas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kolin_Paul>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Parimal_Pal_Chaudhuri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sobhan_Mukherjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vamsi_Boppana>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2000.812666>
foaf:homepage <https://doi.org/10.1109/ICVD.2000.812666>
dc:identifier DBLP conf/vlsid/SikdarPBCBYM00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2000.812666 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Biplab_K._Sikdar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cliff_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gosta_Pada_Biswas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kolin_Paul>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Parimal_Pal_Chaudhuri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sobhan_Mukherjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vamsi_Boppana>
swrc:pages 556-561 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ICVD.2000.812666>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Finite field, Extension field, BIST structure, DFT, Cellular Automata (CA), LFSR, Fault coverage, VLSI design and RTL (xsd:string)
dc:title Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document