Diagnosis of parametric path delay faults. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Mukund_Sivaraman>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489644>
foaf:homepage	<https://doi.org/10.1109/ICVD.1996.489644>
dc:identifier	DBLP conf/vlsid/SivaramanS96 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FICVD.1996.489644 (xsd:string)
dcterms:issued	1996 (xsd:gYear)
rdfs:label	Diagnosis of parametric path delay faults. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Andrzej_J._Strojwas>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Mukund_Sivaraman>
swrc:pages	412-417 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vlsid/SivaramanS96/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vlsid/SivaramanS96>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#SivaramanS96>
rdfs:seeAlso	<https://doi.org/10.1109/ICVD.1996.489644>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject	integrated circuit testing; failure analysis; probability; statistical analysis; delays; fault diagnosis; logic testing; production testing; parametric path delay faults; delay fault testing; diagnosability; chip failure; fabrication process parameter values; path sensitization mechanism; path delay conditions; statistical analysis; ISCAS'89 benchmark circuits; path segment; probability; circuit failure; IC testing; logic testing (xsd:string)
dc:title	Diagnosis of parametric path delay faults. (xsd:string)
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