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dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Srinivasan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2005.107>
foaf:homepage <https://doi.org/10.1109/ICVD.2005.107>
dc:identifier DBLP conf/vlsid/SrinivasanB05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2005.107 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Impact of Channel Engineering on Unity Gain Frequency and Noise-Figure in 90nm NMOS Transistor for RF Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Navakanta_Bhat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Srinivasan>
swrc:pages 392-396 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ICVD.2005.107>
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dc:title Impact of Channel Engineering on Unity Gain Frequency and Noise-Figure in 90nm NMOS Transistor for RF Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document