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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/VenkataramanF97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Venkataraman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1997.568157>
foaf:homepage <https://doi.org/10.1109/ICVD.1997.568157>
dc:identifier DBLP conf/vlsid/VenkataramanF97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1997.568157 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Venkataraman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
swrc:pages 381-387 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/VenkataramanF97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/VenkataramanF97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1997.html#VenkataramanF97>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1997.568157>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document