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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/VenkataramanFP98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Venkataraman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1998.646652>
foaf:homepage <https://doi.org/10.1109/ICVD.1998.646652>
dc:identifier DBLP conf/vlsid/VenkataramanFP98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1998.646652 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Diagnostic Simulation of Sequential Circuits Using Fault Sampling. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janak_H._Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Venkataraman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
swrc:pages 476-481 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/VenkataramanFP98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/VenkataramanFP98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1998.html#VenkataramanFP98>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1998.646652>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Diagnostic fault simulation, Diagnosis, Sequential circuits, Sampling. (xsd:string)
dc:title Diagnostic Simulation of Sequential Circuits Using Fault Sampling. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document