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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/YotsuyanagiHTYAHTT09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Yamazaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Aikyo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiyuki_Tsutsumi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSI.Design.2009.60>
foaf:homepage <https://doi.org/10.1109/VLSI.Design.2009.60>
dc:identifier DBLP conf/vlsid/YotsuyanagiHTYAHTT09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSI.Design.2009.60 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Yamazaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Aikyo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiyuki_Tsutsumi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshinobu_Higami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 91-96 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/YotsuyanagiHTYAHTT09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/YotsuyanagiHTYAHTT09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2009.html#YotsuyanagiHTYAHTT09>
rdfs:seeAlso <https://doi.org/10.1109/VLSI.Design.2009.60>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document