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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsit/DongSYLXLCWWZWR23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chaolun_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pengpeng_Ren>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Puyang_Cai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ru_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Runsheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuying_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaomei_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xin_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xing_Wu_0005>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yewei_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongkang_Xue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zirui_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zixuan_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zuoyuan_Dong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FVLSITechnologyandCir57934.2023.10185380>
foaf:homepage <https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185380>
dc:identifier DBLP conf/vlsit/DongSYLXLCWWZWR23 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FVLSITechnologyandCir57934.2023.10185380 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chaolun_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pengpeng_Ren>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Puyang_Cai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ru_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Runsheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuying_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaomei_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xin_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xing_Wu_0005>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yewei_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongkang_Xue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhigang_Ji>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zirui_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zixuan_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zuoyuan_Dong>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsit/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsit/DongSYLXLCWWZWR23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsit/DongSYLXLCWWZWR23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#DongSYLXLCWWZWR23>
rdfs:seeAlso <https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185380>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsit>
dc:title Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document