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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsit/HaYW23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dongwan_Ha>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_R._Wrenner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruida_Yun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FVLSITechnologyandCir57934.2023.10185242>
foaf:homepage <https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185242>
dc:identifier DBLP conf/vlsit/HaYW23 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FVLSITechnologyandCir57934.2023.10185242 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A 0.22mm2 per Channel Data Link for Reinforced Isolation with >25kVpk Surge Tolerance and >295kV/őľs Common Mode Transient Immunity. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dongwan_Ha>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_R._Wrenner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruida_Yun>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsit/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsit/HaYW23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsit/HaYW23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#HaYW23>
rdfs:seeAlso <https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185242>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsit>
dc:title A 0.22mm2 per Channel Data Link for Reinforced Isolation with >25kVpk Surge Tolerance and >295kV/őľs Common Mode Transient Immunity. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document