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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsit/InoueTKCBYHITI23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ai_Kitoh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gouhei_Tanaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroto_Tamura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Isao_H._Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeaki_Yajima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuya_Iizuka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiangyu_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasushi_Hotta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zolboo_Byambadorj>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FVLSITechnologyandCir57934.2023.10185412>
foaf:homepage <https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185412>
dc:identifier DBLP conf/vlsit/InoueTKCBYHITI23 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FVLSITechnologyandCir57934.2023.10185412 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Long-time-constant leaky-integrating oxygen-vacancy drift-diffusion FET for human-interactive spiking reservoir computing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ai_Kitoh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gouhei_Tanaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroto_Tamura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisashi_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Isao_H._Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeaki_Yajima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuya_Iizuka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiangyu_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasushi_Hotta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zolboo_Byambadorj>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsit/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsit/InoueTKCBYHITI23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsit/InoueTKCBYHITI23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#InoueTKCBYHITI23>
rdfs:seeAlso <https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185412>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsit>
dc:title Long-time-constant leaky-integrating oxygen-vacancy drift-diffusion FET for human-interactive spiking reservoir computing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document