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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsit/SomeyaHAPM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jan_A._Angevare>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kofi_A._A._Makinwa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sining_Pan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Teruki_Someya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincent_Van_Hoek>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSITechnologyandCir46769.2022.9830266>
foaf:homepage <https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830266>
dc:identifier DBLP conf/vlsit/SomeyaHAPM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSITechnologyandCir46769.2022.9830266 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label A 210nW BJT-based Temperature Sensor with an Inaccuracy of ¬Ī0.15¬įC (3ŌÉ) from -15¬įC to 85¬įC. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jan_A._Angevare>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kofi_A._A._Makinwa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sining_Pan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Teruki_Someya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincent_Van_Hoek>
swrc:pages 120-121 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsit/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsit/SomeyaHAPM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsit/SomeyaHAPM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsit/vlsit2022.html#SomeyaHAPM22>
rdfs:seeAlso <https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830266>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsit>
dc:title A 210nW BJT-based Temperature Sensor with an Inaccuracy of ¬Ī0.15¬įC (3ŌÉ) from -15¬įC to 85¬įC. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document