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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsit/ZhengSJZZWLKCNG22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen_Sun_0010>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gan_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kai_Ni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leming_Jiao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiwen_Kong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiao_Gong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaolin_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yue_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zijie_Zheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zuopu_Zhou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSITechnologyandCir46769.2022.9830466>
foaf:homepage <https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830466>
dc:identifier DBLP conf/vlsit/ZhengSJZZWLKCNG22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSITechnologyandCir46769.2022.9830466 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Boosting the Memory Window of the BEOL-Compatible MFMIS Ferroelectric/ Anti-Ferroelectric FETs by Charge Injection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen_Sun_0010>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gan_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kai_Ni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leming_Jiao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiwen_Kong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiao_Gong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaolin_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yue_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zijie_Zheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zuopu_Zhou>
swrc:pages 389-390 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsit/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsit/ZhengSJZZWLKCNG22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsit/ZhengSJZZWLKCNG22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsit/vlsit2022.html#ZhengSJZZWLKCNG22>
rdfs:seeAlso <https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830466>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsit>
dc:title Boosting the Memory Window of the BEOL-Compatible MFMIS Ferroelectric/ Anti-Ferroelectric FETs by Charge Injection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document