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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vnc/StadlerFGDGE17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anatoli_Djanatliev>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christina_Stadler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Eckhoff>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Reinhard_German>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Gruber_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xenia_Flamm>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVNC.2017.8275597>
foaf:homepage <https://doi.org/10.1109/VNC.2017.8275597>
dc:identifier DBLP conf/vnc/StadlerFGDGE17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVNC.2017.8275597 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anatoli_Djanatliev>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christina_Stadler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Eckhoff>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Reinhard_German>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Gruber_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xenia_Flamm>
swrc:pages 195-202 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vnc/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vnc/StadlerFGDGE17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vnc/StadlerFGDGE17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vnc/vnc2017.html#StadlerFGDGE17>
rdfs:seeAlso <https://doi.org/10.1109/VNC.2017.8275597>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vnc>
dc:title A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document