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|---|
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dcterms:bibliographicCitation
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<http://dblp.uni-trier.de/rec/bibtex/conf/vts/2023>
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1109%2FVTS56346.2023>
|
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foaf:homepage
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<https://doi.org/10.1109/VTS56346.2023>
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dc:identifier
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DBLP conf/vts/2023
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dc:identifier
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DOI doi.org%2F10.1109%2FVTS56346.2023
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|
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dc:identifier
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ISBN 979-8-3503-4630-5
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|
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swrc:isbn
|
ISBN 979-8-3503-4630-5
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|
|
dcterms:issued
|
2023
(xsd:gYear)
|
|
rdfs:label
|
41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023
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is
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<https://dblp.l3s.de/d2r/resource/publications/conf/vts/AngioneBGABT23>
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<https://dblp.l3s.de/d2r/resource/publications/conf/vts/AvhadSK23>
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|
dc:publisher
|
IEEE
(xsd:string)
|
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owl:sameAs
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owl:sameAs
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owl:sameAs
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<urn:isbn:979-8-3503-4630-5>
|
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rdfs:seeAlso
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<http://amazon.com/s/ref=nb_ss_gw?field-keywords=979-8-3503-4630-5>
|
|
rdfs:seeAlso
|
<https://doi.org/10.1109/VTS56346.2023>
|
|
swrc:series
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<https://dblp.l3s.de/d2r/resource/conferences/vts>
|
|
dcterms:tableOfContent
|
<http://dblp.uni-trier.de/db/conf/vts/vts2023.html>
|
|
dc:title
|
41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023
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dc:type
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foaf:Document
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