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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/AbdulrazzaqG03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nabil_M._Abdulrazzaq>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2003.1197650>
foaf:homepage <https://doi.org/10.1109/VTEST.2003.1197650>
dc:identifier DBLP conf/vts/AbdulrazzaqG03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2003.1197650 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Path-Delay Fault Simulation for Circuits with Large Numbers of Paths for Very Large Test Sets. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nabil_M._Abdulrazzaq>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandeep_K._Gupta_0001>
swrc:pages 186-196 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/AbdulrazzaqG03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/AbdulrazzaqG03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2003.html#AbdulrazzaqG03>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2003.1197650>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Path-Delay Fault Simulation for Circuits with Large Numbers of Paths for Very Large Test Sets. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document