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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/Al-ArsG02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2002.1011171>
foaf:homepage <https://doi.org/10.1109/VTS.2002.1011171>
dc:identifier DBLP conf/vts/Al-ArsG02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2002.1011171 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Approximating Infinite Dynamic Behavior for DRAM Cell Defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
swrc:pages 401-406 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/Al-ArsG02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/Al-ArsG02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2002.html#Al-ArsG02>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2002.1011171>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject infinite dynamic faults, DRAMs, functional fault models, defect simulation, memory testing (xsd:string)
dc:title Approximating Infinite Dynamic Behavior for DRAM Cell Defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document