Effects of Bit Line Coupling on the Faulty Behavior of DRAMs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/Al-ArsHG04
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vts/Al-ArsHG04
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2004.1299234
>
foaf:
homepage
<
https://doi.org/10.1109/VTEST.2004.1299234
>
dc:
identifier
DBLP conf/vts/Al-ArsHG04
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVTEST.2004.1299234
(xsd:string)
dcterms:
issued
2004
(xsd:gYear)
rdfs:
label
Effects of Bit Line Coupling on the Faulty Behavior of DRAMs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars
>
swrc:
pages
117-122
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vts/2004
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vts/Al-ArsHG04/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vts/Al-ArsHG04
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vts/vts2004.html#Al-ArsHG04
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VTEST.2004.1299234
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vts
>
dc:
subject
DRAMs, bit line coupling, faulty behavior, data backgrounds, Spice simulation
(xsd:string)
dc:
title
Effects of Bit Line Coupling on the Faulty Behavior of DRAMs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document