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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/AmgalanHHW08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Hachmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sybille_Hellebrand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Uranmandakh_Amgalan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2008.34>
foaf:homepage <https://doi.org/10.1109/VTS.2008.34>
dc:identifier DBLP conf/vts/AmgalanHHW08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2008.34 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Signature Rollback - A Technique for Testing Robust Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Hachmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sybille_Hellebrand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Uranmandakh_Amgalan>
swrc:pages 125-130 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/AmgalanHHW08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/AmgalanHHW08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2008.html#AmgalanHHW08>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2008.34>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Robust Design, Embedded Test, Time Redundancy, Rollback and Recovery, Test Quality and Reliability (xsd:string)
dc:title Signature Rollback - A Technique for Testing Robust Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document