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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/AnghelNA00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Issam_Alzaher-Noufal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lorena_Anghel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843827>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843827>
dc:identifier DBLP conf/vts/AnghelNA00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843827 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Issam_Alzaher-Noufal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lorena_Anghel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Nicolaidis>
swrc:pages 55-66 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/AnghelNA00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/AnghelNA00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#AnghelNA00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843827>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Concurrent checking, self–checking circuits, defects, soft errors, timing faults, very deep submicron, nanometer technologies, hardware fault tolerance (xsd:string)
dc:title Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document