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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ArabiK96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karim_Arabi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510896>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510896>
dc:identifier DBLP conf/vts/ArabiK96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510896 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Oscillation-test strategy for analog and mixed-signal integrated circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bozena_Kaminska>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karim_Arabi>
swrc:pages 476-482 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/ArabiK96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/ArabiK96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#ArabiK96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510896>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject analogue integrated circuits; mixed analogue-digital integrated circuits; integrated circuit testing; production testing; circuit oscillations; operational amplifiers; analogue-digital conversion; oscillation test strategy; analog ICs; mixed-signal ICs; low-cost test method; oscillation frequency deviation; wafer-probe testing; final production testing; ASIC testing (xsd:string)
dc:title Oscillation-test strategy for analog and mixed-signal integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document