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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/ArguellesLBMB95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Blanco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Javier_Arg%E2%88%9A%C4%BEelles>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mar%E2%88%9A%E2%89%A0a_Jos%E2%88%9A%C2%A9_L%E2%88%9A%E2%89%A5pez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mar_Mart%E2%88%9A%E2%89%A0nez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Salvador_Bracho>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512624>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512624>
dc:identifier DBLP conf/vts/ArguellesLBMB95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512624 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Iddt testing of continuous-time filters. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Blanco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Javier_Arg%E2%88%9A%C4%BEelles>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mar%E2%88%9A%E2%89%A0a_Jos%E2%88%9A%C2%A9_L%E2%88%9A%E2%89%A5pez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mar_Mart%E2%88%9A%E2%89%A0nez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Salvador_Bracho>
swrc:pages 101-107 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512624>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject continuous time filters; integrated circuit testing; design for testability; built-in self test; automatic testing; CMOS analogue integrated circuits; continuous-time filters; design-for-test methodology; dynamic supply current consumption; built-in current sensor; dynamic current; partitioning methodology; test reliability; automatic test equipment; CMOS (xsd:string)
dc:title Iddt testing of continuous-time filters. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document