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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/AthanLA96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_L._Landis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sami_A._Al-Arian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephan_P._Athan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510845>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510845>
dc:identifier DBLP conf/vts/AthanLA96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510845 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label A novel built-in current sensor for IDDQ testing of deep submicron CMOS ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_L._Landis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sami_A._Al-Arian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephan_P._Athan>
swrc:pages 118-123 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/AthanLA96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/AthanLA96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#AthanLA96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510845>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject CMOS integrated circuits; integrated circuit testing; ULSI; fault diagnosis; leakage currents; electric current measurement; electric sensing devices; built-in current sensor; I/sub DDQ/ testing; deep submicron CMOS ICs; fault detectability; fault diagnosability; ULSI CMOS (xsd:string)
dc:title A novel built-in current sensor for IDDQ testing of deep submicron CMOS ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document