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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/BarnettSGP02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kathleen_G._Purdy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matt_Grady>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_S._Barnett>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2002.1011114>
foaf:homepage <https://doi.org/10.1109/VTS.2002.1011114>
dc:identifier DBLP conf/vts/BarnettSGP02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2002.1011114 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kathleen_G._Purdy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matt_Grady>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_S._Barnett>
swrc:pages 75-80 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/BarnettSGP02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/BarnettSGP02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2002.html#BarnettSGP02>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2002.1011114>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:title Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document