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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/BiswasB08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sounil_Biswas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTS.2008.35>
foaf:homepage <https://doi.org/10.1109/VTS.2008.35>
dc:identifier DBLP conf/vts/BiswasB08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTS.2008.35 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sounil_Biswas>
swrc:pages 299-308 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/BiswasB08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/BiswasB08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2008.html#BiswasB08>
rdfs:seeAlso <https://doi.org/10.1109/VTS.2008.35>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Mixed-signal test, test compaction, pass-fail test data, boolean minimization, minimum constrained subset cover (xsd:string)
dc:title Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document