Design of a fast, easily testable ALU. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vts/BlantonH96>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510829>
foaf:homepage	<https://doi.org/10.1109/VTEST.1996.510829>
dc:identifier	DBLP conf/vts/BlantonH96 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FVTEST.1996.510829 (xsd:string)
dcterms:issued	1996 (xsd:gYear)
rdfs:label	Design of a fast, easily testable ALU. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
swrc:pages	9-16 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vts/BlantonH96/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vts/BlantonH96>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vts/vts1996.html#BlantonH96>
rdfs:seeAlso	<https://doi.org/10.1109/VTEST.1996.510829>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject	adders; digital arithmetic; logic arrays; fault diagnosis; logic testing; integrated circuit testing; automatic testing; carry logic; integrated circuit design; ALU; arithmetic-logic unit; adder design; L-testable design; level-testable; test patterns; functional faults; carry-lookahead addition; area overhead; 8 bit (xsd:string)
dc:title	Design of a fast, easily testable ALU. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document