[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/BoatengTT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.2000.843842>
foaf:homepage <https://doi.org/10.1109/VTEST.2000.843842>
dc:identifier DBLP conf/vts/BoatengTT00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.2000.843842 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Takahashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwame_Osei_Boateng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuzo_Takamatsu>
swrc:pages 171-178 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/BoatengTT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/BoatengTT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2000.html#BoatengTT00>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.2000.843842>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject test generation, iterative logic arrays, fixed-coverage fixed-size test set, BIST (xsd:string)
dc:title General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document