Reliability evaluation of combinational logic circuits by symbolic simulation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/BoglioloDOR95
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1995
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Reliability evaluation of combinational logic circuits by symbolic simulation.
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integrated circuit reliability; combinational circuits; circuit analysis computing; digital simulation; logic CAD; VLSI; reliability evaluation; VLSI; mcnc benchmark circuits; fault-tolerant combinational logic circuits; circuit functionality; fault indicators; control variables; BDD-based symbolic simulation; undetectable multiple faults
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Reliability evaluation of combinational logic circuits by symbolic simulation.
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