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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/BoppanaHF96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ismed_Hartanto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vamsi_Boppana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510854>
foaf:homepage <https://doi.org/10.1109/VTEST.1996.510854>
dc:identifier DBLP conf/vts/BoppanaHF96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1996.510854 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Full fault dictionary storage based on labeled tree encoding. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ismed_Hartanto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vamsi_Boppana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/W._Kent_Fuchs>
swrc:pages 174-179 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/BoppanaHF96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/BoppanaHF96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1996.html#BoppanaHF96>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1996.510854>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject encoding; fault diagnosis; logic testing; VLSI; integrated circuit testing; automatic testing; digital storage; fault trees; circuit analysis computing; full fault dictionary storage; labeled tree encoding; fault dictionary compaction; binary string code; implicit storage (xsd:string)
dc:title Full fault dictionary storage based on labeled tree encoding. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document