Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/CalinAN99
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Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS.
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Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS.
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