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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/CarlettaP94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christos_A._Papachristou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joan_Carletta>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1995.512678>
foaf:homepage <https://doi.org/10.1109/VTEST.1995.512678>
dc:identifier DBLP conf/vts/CarlettaP94 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVTEST.1995.512678 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Structural constraints for circular self-test paths. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christos_A._Papachristou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joan_Carletta>
swrc:pages 486-491 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vts/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/CarlettaP94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/CarlettaP94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts1995.html#CarlettaP94>
rdfs:seeAlso <https://doi.org/10.1109/VTEST.1995.512678>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject built-in self test; automatic testing; logic testing; sequential circuits; integrated circuit testing; flip-flops; circular self-test paths; register transfer level circuits; built-in self test; bit-level correlation; test quality; register adjacency (xsd:string)
dc:title Structural constraints for circular self-test paths. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document