A sampling technique for diagnostic fault simulation. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vts/Chakravarty96>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FVTEST.1996.510857>
foaf:homepage	<https://doi.org/10.1109/VTEST.1996.510857>
dc:identifier	DBLP conf/vts/Chakravarty96 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FVTEST.1996.510857 (xsd:string)
dcterms:issued	1996 (xsd:gYear)
rdfs:label	A sampling technique for diagnostic fault simulation. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
swrc:pages	192-197 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vts/1996>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vts/Chakravarty96/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vts/Chakravarty96>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vts/vts1996.html#Chakravarty96>
rdfs:seeAlso	<https://doi.org/10.1109/VTEST.1996.510857>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject	fault diagnosis; circuit analysis computing; equivalence classes; set theory; integrated circuit testing; sampling technique; diagnostic fault simulation; diagnostic test sets; approximation algorithm; EC/IC Sampling; equivalence classes; indistinguishable classes (xsd:string)
dc:title	A sampling technique for diagnostic fault simulation. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document