Quantitative analysis of very-low-voltage testing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vts/ChangM96
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1996
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Quantitative analysis of very-low-voltage testing.
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integrated circuit testing; CMOS integrated circuits; VLSI; failure analysis; integrated circuit noise; quantitative analysis; very-low-voltage testing; static CMOS chips; supply voltage; threshold voltage; rated conditions; early-life failures; test conditions; test speed; VLSI
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Quantitative analysis of very-low-voltage testing.
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